Instrument details: | |
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Type: | Electron Microscope |
Make: | Carl Zeiss, Germany |
Model No: | EVO, MA10 |
Essential specification: | |
Filament type: | LaB6 |
Measurement range: | Size range = 0.3 nm – 5 µm (diameter) |
Acceleration Voltage: | 0.2 – 30 kV |
Probe current | 0.2 pA – 5 µA |
Resolution: | 2-20 nm |
Magnification: | <7- 10,00,000 X |
X- Ray analysis: | 8.5 mm AWD and 35° take-off angle |
Field of view: | 6 mm at AWD |
Pressure Range: | 10-3000 Pa |
Maximum specimen height: | 100 mm |
Software: | ZEN core |
Working principle: | |
A scanning electron microscope (SEM) scans a focused electron beam over a surface to create an image. Electrons are produced at the top of the column, accelerated down and passed through a combination of lenses and apertures to produce a focused beam of electrons which hits the surface of the sample. The electrons in the beam scan the sample in raster fashion, producing various signals that are collected by collector, amplified by scintillator, detected by detectors followed by recording the information about surface topography and composition of the defined area of the sample. | |
E-manual: | |
http://zeiss.taimaz.com/wp-content/uploads/2017/07/EN_42_011_092_EVO_rel_4-0.pdf | |
Applications: | |
Nanomaterial characterization: size and shape, particle and gunshot residue (GSR) analysis. | |
Samples: | |
Sample preparation | at center/ self-prepared sample |
Type of samples | polymeric/metallic/peptide/protein/coatings/fiber (nature) solid, liquid (form) |
Type of solvent | organic solvent |
Analysis | images at different specific for size and shape |
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