Transmission Electron Microscope G2 30-U twin microscope

Instrument details:
Type: Electron Microscope
Make: FEI, Thermo Fisher Scientific, Waltham, Massachusetts, USA
Model No: Tecnai G2 30-U twin microscope
Essential specification:
Filament type: LaB6
Gun vacuum: < 5.0 x 10-7 Pa
Column vacuum: < 2.0 x 10-5 Pa
Accelerating Voltage 300 kV
Resolution: 0.1 nm (lattice), 0.24 nm (point-to-point)
Magnification: 60 X – 970 KX
Grid type: Cu or Ni (mesh size)
Detector type: High Angle Annual Dark-field detector, EDAX SDD X-ray detector
Software: FEI application software
Working principle:
A high energy beam of electrons is shone through a very thin sample and the interactions between the electrons and the atoms. Some atoms of the material prominently stop or deflect highly energetic electrons on the way through the sample. Those electrons are collected from below the sample onto a phosphorescent screen or through a camera. In the regions where electrons do not pass through the sample the image is dark. Where electrons are unscattered, the image is brighter and there are a range of greys in between depending on the way the electrons interact with and are scattered by the sample. TEM is used to observe features such as the crystal structure and features in the structure like dislocations and grain boundaries.
Nanomaterial characterization: size, shape, elemental composition, crystallography
Sample preparation at center/ self-prepared sample
Type of samples polymeric/metallic/peptide or protein (nature) solid, liquid (form)
Type of solvent organic solvent
Analysis images at different magnification for size and shape
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