X-Ray Diffraction

Instrument details:
Type: X-Ray Diffraction
Make: Rigaku
Model No: Miniflex-600
Essential specification:
Benefit: Phase analysis of poly-crystalline materials
Scanning range: -3 to 145° (2θ)
Temperature Range: NA
Power requirements: 1Ø, 100-240 V 50/60 Hz
Minimum step width : 0.005° (2θ)
Scanning speed: 0.01 to 100°/min (2θ)
Software: Miniflex
Sample Type: Solid
Minimum sample volume: 1gm
Accuracy: ±0.02°
Precision / Repeatability: NA
Result Type :
Working principle:
X-Ray Diffraction, frequently abbreviated as XRD, is a non-destructive test method used to analyze the structure of crystalline materials. XRD analysis, by way of the study of the crystal structure, is used to identify the crystalline phases present in a material and thereby reveal chemical composition. X-ray diffraction is based on constructive interference of monochromatic X-rays and a crystalline sample. These X-rays are generated by a cathode ray tube, filtered to produce monochromatic radiation, collimated to concentrate, and directed toward the sample.